Bingchen Wang, Sigeru Omatu, Toshiro Abe. Failure analysis of transmission devices using learning vector quantization. In Proceedings of the IEEE International Symposium on Computational Intelligence in Robotics and Automation: Computational Intelligence in Robotics and Automation for the New Millennium, CIRA 2003, Kobe, Japan, July 16-20, 2003. pages 864-869, IEEE, 2003. [doi]
@inproceedings{WangOA03, title = {Failure analysis of transmission devices using learning vector quantization}, author = {Bingchen Wang and Sigeru Omatu and Toshiro Abe}, year = {2003}, doi = {10.1109/CIRA.2003.1222293}, url = {http://dx.doi.org/10.1109/CIRA.2003.1222293}, researchr = {https://researchr.org/publication/WangOA03}, cites = {0}, citedby = {0}, pages = {864-869}, booktitle = {Proceedings of the IEEE International Symposium on Computational Intelligence in Robotics and Automation: Computational Intelligence in Robotics and Automation for the New Millennium, CIRA 2003, Kobe, Japan, July 16-20, 2003}, publisher = {IEEE}, isbn = {0-7803-7866-0}, }