Bingchen Wang, Sigeru Omatu, Toshiro Abe. Failure analysis of transmission devices using learning vector quantization. In Proceedings of the IEEE International Symposium on Computational Intelligence in Robotics and Automation: Computational Intelligence in Robotics and Automation for the New Millennium, CIRA 2003, Kobe, Japan, July 16-20, 2003. pages 864-869, IEEE, 2003. [doi]
Abstract is missing.