A Theoretical Analysis on the Reliability of Multigenerational IoT

Xianping Wang, Stephan Olariu, Hao Qiu, Fei Xie, Anthony Choi, Wenbing Zhao 0001. A Theoretical Analysis on the Reliability of Multigenerational IoT. In 2018 IEEE International Conference on Electro/Information Technology, EIT 2018, Rochester, MI, USA, May 3-5, 2018. pages 203-208, IEEE, 2018. [doi]

Abstract

Abstract is missing.