Fine-Grained Electromagnetic Side-Channel Analysis Resilient Secure AES Core with Stacked Voltage Domains and Spatio-temporally Randomized Circuit Blocks

Meizhi Wang, Sirish Oruganti, Shanshan Xie, Raghavan Kumar, Sanu Mathew, Jaydeep P. Kulkarni. Fine-Grained Electromagnetic Side-Channel Analysis Resilient Secure AES Core with Stacked Voltage Domains and Spatio-temporally Randomized Circuit Blocks. In 48th IEEE European Solid State Circuits Conference, ESSCIRC 2022, Milan, Italy, September 19-22, 2022. pages 529-532, IEEE, 2022. [doi]

@inproceedings{WangOXKMK22,
  title = {Fine-Grained Electromagnetic Side-Channel Analysis Resilient Secure AES Core with Stacked Voltage Domains and Spatio-temporally Randomized Circuit Blocks},
  author = {Meizhi Wang and Sirish Oruganti and Shanshan Xie and Raghavan Kumar and Sanu Mathew and Jaydeep P. Kulkarni},
  year = {2022},
  doi = {10.1109/ESSCIRC55480.2022.9911449},
  url = {https://doi.org/10.1109/ESSCIRC55480.2022.9911449},
  researchr = {https://researchr.org/publication/WangOXKMK22},
  cites = {0},
  citedby = {0},
  pages = {529-532},
  booktitle = {48th IEEE European Solid State Circuits Conference, ESSCIRC 2022, Milan, Italy, September 19-22, 2022},
  publisher = {IEEE},
  isbn = {978-1-6654-8494-7},
}