An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology - researchr publication authors

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Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao. An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 511-514, IEEE, 2007. [doi]

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