Long Wang, James C. Spall. Beyond the identification of reliability for system with binary subsystems. In 2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017. pages 158-163, IEEE, 2017. [doi]
@inproceedings{WangS17-15, title = {Beyond the identification of reliability for system with binary subsystems}, author = {Long Wang and James C. Spall}, year = {2017}, doi = {10.23919/ACC.2017.7962947}, url = {https://doi.org/10.23919/ACC.2017.7962947}, researchr = {https://researchr.org/publication/WangS17-15}, cites = {0}, citedby = {0}, pages = {158-163}, booktitle = {2017 American Control Conference, ACC 2017, Seattle, WA, USA, May 24-26, 2017}, publisher = {IEEE}, isbn = {978-1-5090-5992-8}, }