Tianchen Wang, Sandeep Kumar Samal, Sung Kyu Lim, Yiyu Shi. Entropy Production-Based Full-Chip Fatigue Analysis: From Theory to Mobile Applications. IEEE Trans. on CAD of Integrated Circuits and Systems, 38(1):84-95, 2019. [doi]
@article{WangSLS19,
title = {Entropy Production-Based Full-Chip Fatigue Analysis: From Theory to Mobile Applications},
author = {Tianchen Wang and Sandeep Kumar Samal and Sung Kyu Lim and Yiyu Shi},
year = {2019},
doi = {10.1109/TCAD.2018.2803623},
url = {https://doi.org/10.1109/TCAD.2018.2803623},
researchr = {https://researchr.org/publication/WangSLS19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {38},
number = {1},
pages = {84-95},
}