A system for Evaluating the Robustness of Embedded Intelligent Chips and Models

Chenguang Wang, Zhixiao Sun, Qing Luo, Xinyu Wang, Tao Zhang, Qianru Wei, Jing Cheng, Depeng Gao. A system for Evaluating the Robustness of Embedded Intelligent Chips and Models. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021 - Companion, Hainan, China, December 6-10, 2021. pages 298-305, IEEE, 2021. [doi]

@inproceedings{WangSLWZWCG21,
  title = {A system for Evaluating the Robustness of Embedded Intelligent Chips and Models},
  author = {Chenguang Wang and Zhixiao Sun and Qing Luo and Xinyu Wang and Tao Zhang and Qianru Wei and Jing Cheng and Depeng Gao},
  year = {2021},
  doi = {10.1109/QRS-C55045.2021.00052},
  url = {https://doi.org/10.1109/QRS-C55045.2021.00052},
  researchr = {https://researchr.org/publication/WangSLWZWCG21},
  cites = {0},
  citedby = {0},
  pages = {298-305},
  booktitle = {21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021 - Companion, Hainan, China, December 6-10, 2021},
  publisher = {IEEE},
  isbn = {978-1-6654-7836-6},
}