A system for Evaluating the Robustness of Embedded Intelligent Chips and Models

Chenguang Wang, Zhixiao Sun, Qing Luo, Xinyu Wang, Tao Zhang, Qianru Wei, Jing Cheng, Depeng Gao. A system for Evaluating the Robustness of Embedded Intelligent Chips and Models. In 21st IEEE International Conference on Software Quality, Reliability and Security, QRS 2021 - Companion, Hainan, China, December 6-10, 2021. pages 298-305, IEEE, 2021. [doi]

Abstract

Abstract is missing.