SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology - researchr publication authors

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Haibin Wang, Ao Sheng, Shiqi Wang, Jinshun Bi, Li Chen, Xiaofeng Liu. SEU reduction effectiveness of common centroid layout in differential latch at 130-nm CMOS technology. Microelectronics Reliability, 72:39-44, 2017. [doi]

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