Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge

Kaihong Wang, Pengju Sun, Binxin Zhu, Quanming Luo, Xiong Du. Monitoring Chip Branch Failure in Multichip IGBT Modules Based on Gate Charge. IEEE Transactions on Industrial Electronics, 70(5):5214-5223, 2023. [doi]

Abstract

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