Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski. An Efficient and Effective Methodology on the Multiple Fault Diagnosis. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 329-338, IEEE Computer Society, 2003. [doi]
Abstract is missing.