Real-Time Aging Monitoring for IGBT Modules Using Case Temperature

Ze Wang, Bo Tian, Wei Qiao, Liyan Qu. Real-Time Aging Monitoring for IGBT Modules Using Case Temperature. IEEE Transactions on Industrial Electronics, 63(2):1168-1178, 2016. [doi]

Authors

Ze Wang

This author has not been identified. Look up 'Ze Wang' in Google

Bo Tian

This author has not been identified. Look up 'Bo Tian' in Google

Wei Qiao

This author has not been identified. Look up 'Wei Qiao' in Google

Liyan Qu

This author has not been identified. Look up 'Liyan Qu' in Google