Chundong Wang, Weng-Fai Wong. Extending the lifetime of NAND flash memory by salvaging bad blocks. In Wolfgang Rosenstiel, Lothar Thiele, editors, 2012 Design, Automation & Test in Europe Conference & Exhibition, DATE 2012, Dresden, Germany, March 12-16, 2012. pages 260-263, IEEE, 2012. [doi]
Abstract is missing.