Jian Wang, Wenhua Wang, Ru Huang, Yunpeng Pei, Shoubin Xue, Xin an Wang, Chunhui Fan, Yangyuan Wang. Deteriorated radiation effects impact on the characteristics of MOS transistors with multi-finger configuration. Microelectronics Reliability, 50(8):1094-1097, 2010. [doi]
Abstract is missing.