Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes - researchr publication authors

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Lihao Wang, Yu Wu, Yunpeng Jia, Yuanfu Zhao, Zhonghan Deng. Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes. In EITCE 2020: 4th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, 6 November, 2020 - 8 November, 2020. pages 965-969, ACM, 2020. [doi]

This author has not been identified. Look up 'Lihao Wang' in GoogleThis author has not been identified. Look up 'Yu Wu' in GoogleThis author has not been identified. Look up 'Yunpeng Jia' in GoogleThis author has not been identified. Look up 'Yuanfu Zhao' in GoogleThis author has not been identified. Look up 'Zhonghan Deng' in Google

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