Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes

Lihao Wang, Yu Wu, Yunpeng Jia, Yuanfu Zhao, Zhonghan Deng. Influence of Backside p-Region Width on the Overcurrent Reverse Recovery of High-voltage RFC Diodes. In EITCE 2020: 4th International Conference on Electronic Information Technology and Computer Engineering, Xiamen, China, 6 November, 2020 - 8 November, 2020. pages 965-969, ACM, 2020. [doi]

Abstract

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