A built-in self-test and self-diagnosis scheme for embedded SRAM

Chih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin. A built-in self-test and self-diagnosis scheme for embedded SRAM. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 45-50, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.