A Novel Depth-Connected Region-Based Convolutional Neural Network for Small Defect Detection in Additive Manufacturing

Yiming Wang 0001, Zidong Wang, Weibo Liu 0001, Nianyin Zeng, Stanislao Lauria, Camilo Prieto, Fredrik Sikström, Hui Yu 0001, Xiaohui Liu 0001. A Novel Depth-Connected Region-Based Convolutional Neural Network for Small Defect Detection in Additive Manufacturing. Cognitive Computation, 17(1):36, February 2025. [doi]

Abstract

Abstract is missing.