Shunzhuo Wang, Fei Wu, Zhonghai Lu, You Zhou, Qin Xiong, Meng Zhang, Changsheng Xie. Lifetime adaptive ECC in NAND flash page management. In David Atienza, Giorgio Di Natale, editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017. pages 1253-1556, IEEE, 2017. [doi]
@inproceedings{WangWLZXZX17,
title = {Lifetime adaptive ECC in NAND flash page management},
author = {Shunzhuo Wang and Fei Wu and Zhonghai Lu and You Zhou and Qin Xiong and Meng Zhang and Changsheng Xie},
year = {2017},
doi = {10.23919/DATE.2017.7927182},
url = {https://doi.org/10.23919/DATE.2017.7927182},
researchr = {https://researchr.org/publication/WangWLZXZX17},
cites = {0},
citedby = {0},
pages = {1253-1556},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2017, Lausanne, Switzerland, March 27-31, 2017},
editor = {David Atienza and Giorgio Di Natale},
publisher = {IEEE},
isbn = {978-3-9815370-8-6},
}