L. Wang, X. Wang, Z. T. Shi, R. Ma, C. Zhang, Z. Dong, F. Lu, H. Zhao, A. Wang. Scalable behavior modeling for 3D field-programmable ESD protection structures. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-4, IEEE, 2013. [doi]
@inproceedings{WangWSMZDLZW13,
title = {Scalable behavior modeling for 3D field-programmable ESD protection structures},
author = {L. Wang and X. Wang and Z. T. Shi and R. Ma and C. Zhang and Z. Dong and F. Lu and H. Zhao and A. Wang},
year = {2013},
doi = {10.1109/CICC.2013.6658492},
url = {http://dx.doi.org/10.1109/CICC.2013.6658492},
researchr = {https://researchr.org/publication/WangWSMZDLZW13},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013},
publisher = {IEEE},
}