A low cost test data compression technique for high n-detection fault coverage - researchr publication authors

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Seongmoon Wang, Zhanglei Wang, Wenlong Wei, Srimat T. Chakradhar. A low cost test data compression technique for high n-detection fault coverage. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-10, IEEE, 2007. [doi]

This author has not been identified. Look up 'Seongmoon Wang' in GoogleThis author has not been identified. Look up 'Zhanglei Wang' in GoogleThis author has not been identified. Look up 'Wenlong Wei' in GoogleThis author has not been identified. Look up 'Srimat T. Chakradhar' in Google

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