Xiaofei Wang, Bing Xing Wang, Wenhui Wu, Yili Hong 0001. Reliability analysis for accelerated degradation data based on the Wiener process with random effects. Quality and Reliability Eng. Int., 36(6):1969-1981, 2020. [doi]
@article{WangWWH20-1,
title = {Reliability analysis for accelerated degradation data based on the Wiener process with random effects},
author = {Xiaofei Wang and Bing Xing Wang and Wenhui Wu and Yili Hong 0001},
year = {2020},
doi = {10.1002/qre.2668},
url = {https://doi.org/10.1002/qre.2668},
researchr = {https://researchr.org/publication/WangWWH20-1},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {36},
number = {6},
pages = {1969-1981},
}