Adaptively tolerate power-gating-induced power/ground noise under process variations

Zhe Wang, Xuan Wang, Jiang Xu, Xiaowen Wu, Zhehui Wang, Peng Yang, Luan H. K. Duong, Haoran Li, Rafael Kioji Vivas Maeda, Zhifei Wang. Adaptively tolerate power-gating-induced power/ground noise under process variations. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 483-488, ACM, 2015. [doi]

Abstract

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