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Removing Image Artifacts From Scratched Lens Protectors

Yufei Wang, Renjie Wan, Wenhan Yang, Bihan Wen, Lap-Pui Chau, Alex C. Kot. Removing Image Artifacts From Scratched Lens Protectors. In IEEE International Symposium on Circuits and Systems, ISCAS 2023, Monterey, CA, USA, May 21-25, 2023. pages 1-5, IEEE, 2023. [doi]

Authors

Yufei Wang

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Renjie Wan

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Wenhan Yang

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Bihan Wen

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Lap-Pui Chau

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Alex C. Kot

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