Yufei Wang, Renjie Wan, Wenhan Yang, Bihan Wen, Lap-Pui Chau, Alex C. Kot. Removing Image Artifacts From Scratched Lens Protectors. In IEEE International Symposium on Circuits and Systems, ISCAS 2023, Monterey, CA, USA, May 21-25, 2023. pages 1-5, IEEE, 2023. [doi]
Abstract is missing.