Reliability Analysis on Shifted and Random Declustering Block Layouts in Scale-Out Storage Architectures - researchr publication authors

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Jun Wang, RuiJun Wang, Jiangling Yin, Huijun Zhu, Yuanyuan Yang. Reliability Analysis on Shifted and Random Declustering Block Layouts in Scale-Out Storage Architectures. In 9th IEEE International Conference on Networking, Architecture, and Storage, NAS 2014, Tianjin, China, August 6-8, 2014. pages 148-157, IEEE, 2014. [doi]

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