Reliability Analysis on Shifted and Random Declustering Block Layouts in Scale-Out Storage Architectures

Jun Wang, RuiJun Wang, Jiangling Yin, Huijun Zhu, Yuanyuan Yang. Reliability Analysis on Shifted and Random Declustering Block Layouts in Scale-Out Storage Architectures. In 9th IEEE International Conference on Networking, Architecture, and Storage, NAS 2014, Tianjin, China, August 6-8, 2014. pages 148-157, IEEE, 2014. [doi]

@inproceedings{WangWYZY14,
  title = {Reliability Analysis on Shifted and Random Declustering Block Layouts in Scale-Out Storage Architectures},
  author = {Jun Wang and RuiJun Wang and Jiangling Yin and Huijun Zhu and Yuanyuan Yang},
  year = {2014},
  doi = {10.1109/NAS.2014.32},
  url = {http://dx.doi.org/10.1109/NAS.2014.32},
  researchr = {https://researchr.org/publication/WangWYZY14},
  cites = {0},
  citedby = {0},
  pages = {148-157},
  booktitle = {9th IEEE International Conference on Networking, Architecture, and Storage, NAS 2014, Tianjin, China, August 6-8, 2014},
  publisher = {IEEE},
}