Ke Wang, Qi Xia, Tielin Shi, Guanglan Liao, Shiyuan Liu. A pattern matching method using geometric information of images. In 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, February 20-23, 2011. pages 33-36, IEEE, 2011. [doi]
@inproceedings{WangXSLL11,
title = {A pattern matching method using geometric information of images},
author = {Ke Wang and Qi Xia and Tielin Shi and Guanglan Liao and Shiyuan Liu},
year = {2011},
doi = {10.1109/NEMS.2011.6017288},
url = {http://dx.doi.org/10.1109/NEMS.2011.6017288},
researchr = {https://researchr.org/publication/WangXSLL11},
cites = {0},
citedby = {0},
pages = {33-36},
booktitle = {6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, February 20-23, 2011},
publisher = {IEEE},
}