Ke Wang, Qi Xia, Tielin Shi, Guanglan Liao, Shiyuan Liu. A pattern matching method using geometric information of images. In 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2011, Kaohsiung, Taiwan, February 20-23, 2011. pages 33-36, IEEE, 2011. [doi]
Abstract is missing.