Spice-Compatible Modeling of Double Barrier MTJ for Highly Reliable Circuits

You Wang, Yefan Xu, Chaoyue Zhang, Yu Gong, Hao Cai, Weiqiang Liu 0001. Spice-Compatible Modeling of Double Barrier MTJ for Highly Reliable Circuits. In IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2023, Hefei, China, October 27-29, 2023. pages 65-66, IEEE, 2023. [doi]

Abstract

Abstract is missing.