Thermal management of coaxial through-silicon-via (C-TSV)-based three-dimensional integrated circuit (3D IC)

Fengjuan Wang, Ningmei Yu. Thermal management of coaxial through-silicon-via (C-TSV)-based three-dimensional integrated circuit (3D IC). IEICE Electronic Express, 13(11):20151117, 2016. [doi]

@article{WangY16-13,
  title = {Thermal management of coaxial through-silicon-via (C-TSV)-based three-dimensional integrated circuit (3D IC)},
  author = {Fengjuan Wang and Ningmei Yu},
  year = {2016},
  url = {https://www.jstage.jst.go.jp/article/elex/13/11/13_13.20151117/_article},
  researchr = {https://researchr.org/publication/WangY16-13},
  cites = {0},
  citedby = {0},
  journal = {IEICE Electronic Express},
  volume = {13},
  number = {11},
  pages = {20151117},
}