Evaluating the manufacturing capability of a lithographic area by using a novel vague GERT

Chia-Nan Wang, Gino K. Yang, Kuo-Chen Hung, Kuei-Hu Chang, Peter Chu. Evaluating the manufacturing capability of a lithographic area by using a novel vague GERT. Expert Syst. Appl., 38(1):923-932, 2011. [doi]

Abstract

Abstract is missing.