Jun Wang, Xibo Yuan, Navid Rasekh. Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices. In The 46th Annual Conference of the IEEE Industrial Electronics Society, IECON 2020, Singapore, October 18-21, 2020. pages 4717-4724, IEEE, 2020. [doi]
Abstract is missing.