Nan Wang, Zhonghu Yuan, David Wang. Improving Process Fault Detection and Diagnosis Using Robust PCA and Robust FDA. In Mark Burgin, Masud H. Chowdhury, Chan H. Ham, Simone A. Ludwig, Weilian Su, Sumanth Yenduri, editors, CSIE 2009, 2009 WRI World Congress on Computer Science and Information Engineering, March 31 - April 2, 2009, Los Angeles, California, USA, 7 Volumes. pages 54-59, IEEE Computer Society, 2009. [doi]
Abstract is missing.