Error-Constraint Deep Learning Scheme for Electrical Impedance Tomography (EIT) - researchr publication authors

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Qi Wang, Hanyu Zhang, Xiuyan Li, Xiaojie Duan, Jianming Wang, Ronghua Zhang, Hong Zhang, Yanhe Ma, Huaxiang Wang, Jiabin Jia. Error-Constraint Deep Learning Scheme for Electrical Impedance Tomography (EIT). IEEE T. Instrumentation and Measurement, 71:1-11, 2022. [doi]

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