Error-Constraint Deep Learning Scheme for Electrical Impedance Tomography (EIT)

Qi Wang, Hanyu Zhang, Xiuyan Li, Xiaojie Duan, Jianming Wang, Ronghua Zhang, Hong Zhang, Yanhe Ma, Huaxiang Wang, Jiabin Jia. Error-Constraint Deep Learning Scheme for Electrical Impedance Tomography (EIT). IEEE T. Instrumentation and Measurement, 71:1-11, 2022. [doi]

@article{WangZLDWZZMWJ22,
  title = {Error-Constraint Deep Learning Scheme for Electrical Impedance Tomography (EIT)},
  author = {Qi Wang and Hanyu Zhang and Xiuyan Li and Xiaojie Duan and Jianming Wang and Ronghua Zhang and Hong Zhang and Yanhe Ma and Huaxiang Wang and Jiabin Jia},
  year = {2022},
  doi = {10.1109/TIM.2021.3135327},
  url = {https://doi.org/10.1109/TIM.2021.3135327},
  researchr = {https://researchr.org/publication/WangZLDWZZMWJ22},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {71},
  pages = {1-11},
}