Bin Wang, Yun Zeng, Guoli Li, Yu Xia, Hui Xu, Caixia Huang. Analysis and Simulation of Temperature Characteristic of Sensitivity for SOI Lateral PIN Photodiode Gated by Transparent Electrode. In Weixia Xu, Liquan Xiao, Jinwen Li, Chengyi Zhang, editors, Computer Engineering and Technology - 19th CCF Conference, NCCET 2015, Hefei, China, October 18-20, 2015, Revised Selected Papers. Volume 592 of Communications in Computer and Information Science, pages 173-181, Springer, 2015. [doi]
Abstract is missing.