Ron Wantuck. Test Quality: Required Stuck-at Fault Coverage with the Use of I::DDQ:: Testing. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 301, IEEE Computer Society, 1995.
@inproceedings{Wantuck95,
title = {Test Quality: Required Stuck-at Fault Coverage with the Use of I::DDQ:: Testing},
author = {Ron Wantuck},
year = {1995},
tags = {test coverage, testing, coverage},
researchr = {https://researchr.org/publication/Wantuck95},
cites = {0},
citedby = {0},
pages = {301},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}