A novel intelligent approach to anchorage measurement using electron microscopy

Karol Warne, Girijesh Prasad, Nazmul H. Siddique, Liam P. Maguire. A novel intelligent approach to anchorage measurement using electron microscopy. In Proceedings of the IEEE International Conference on Systems, Man & Cybernetics: Washington, D.C., USA, 5-8 October 2003. pages 3810-3815, IEEE, 2003. [doi]

Authors

Karol Warne

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Girijesh Prasad

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Nazmul H. Siddique

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Liam P. Maguire

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