A novel intelligent approach to anchorage measurement using electron microscopy

Karol Warne, Girijesh Prasad, Nazmul H. Siddique, Liam P. Maguire. A novel intelligent approach to anchorage measurement using electron microscopy. In Proceedings of the IEEE International Conference on Systems, Man & Cybernetics: Washington, D.C., USA, 5-8 October 2003. pages 3810-3815, IEEE, 2003. [doi]

Abstract

Abstract is missing.