Kimberly S. Wasson, Kendra N. Schmid, Robyn R. Lutz, John C. Knight. Using Occurrence Properties of Defect Report Data to Improve Requirements. In 13th IEEE International Conference on Requirements Engineering (RE 2005), 29 August - 2 September 2005, Paris, France. pages 253-262, IEEE Computer Society, 2005. [doi]
@inproceedings{WassonSLK05,
title = {Using Occurrence Properties of Defect Report Data to Improve Requirements},
author = {Kimberly S. Wasson and Kendra N. Schmid and Robyn R. Lutz and John C. Knight},
year = {2005},
doi = {10.1109/RE.2005.77},
url = {http://doi.ieeecomputersociety.org/10.1109/RE.2005.77},
tags = {data-flow, C++},
researchr = {https://researchr.org/publication/WassonSLK05},
cites = {0},
citedby = {0},
pages = {253-262},
booktitle = {13th IEEE International Conference on Requirements Engineering (RE 2005), 29 August - 2 September 2005, Paris, France},
publisher = {IEEE Computer Society},
isbn = {0-7695-2425-7},
}