Refractive index & physical thickness distributions measurement and consideration of dependence of measurement accuracy on scanning interval using low-coherence digital holography - researchr publication authors

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Kaho Watanabe, Takanori Nomura. Refractive index & physical thickness distributions measurement and consideration of dependence of measurement accuracy on scanning interval using low-coherence digital holography. In Proceedings of the 2013 IEEE/SICE International Symposium on System Integration, SII 2013, Kobe, Japan, December 15-17, 2013. pages 586-591, IEEE, 2013. [doi]

This author has not been identified. Look up 'Kaho Watanabe' in GoogleThis author has not been identified. Look up 'Takanori Nomura' in Google

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