Kaho Watanabe, Takanori Nomura. Refractive index & physical thickness distributions measurement and consideration of dependence of measurement accuracy on scanning interval using low-coherence digital holography. In Proceedings of the 2013 IEEE/SICE International Symposium on System Integration, SII 2013, Kobe, Japan, December 15-17, 2013. pages 586-591, IEEE, 2013. [doi]
@inproceedings{WatanabeN13-0,
title = {Refractive index & physical thickness distributions measurement and consideration of dependence of measurement accuracy on scanning interval using low-coherence digital holography},
author = {Kaho Watanabe and Takanori Nomura},
year = {2013},
doi = {10.1109/SII.2013.6776608},
url = {http://dx.doi.org/10.1109/SII.2013.6776608},
researchr = {https://researchr.org/publication/WatanabeN13-0},
cites = {0},
citedby = {0},
pages = {586-591},
booktitle = {Proceedings of the 2013 IEEE/SICE International Symposium on System Integration, SII 2013, Kobe, Japan, December 15-17, 2013},
publisher = {IEEE},
}