Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect - researchr publication authors

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Yann Weber, Linda Buffo, Béatrice Vanhuffel, Nicholas Lee, Neal Stirlen, Jeff Chen, Xiang-Dong Wang. Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect. Microelectronics Reliability, 54(9-10):2064-2069, 2014. [doi]

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