Yann Weber, Linda Buffo, Béatrice Vanhuffel, Nicholas Lee, Neal Stirlen, Jeff Chen, Xiang-Dong Wang. Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect. Microelectronics Reliability, 54(9-10):2064-2069, 2014. [doi]
@article{WeberBVLSCW14,
title = {Signal noise perturbation on automotive mixed-mode semiconductor device generated by graded substrate defect},
author = {Yann Weber and Linda Buffo and Béatrice Vanhuffel and Nicholas Lee and Neal Stirlen and Jeff Chen and Xiang-Dong Wang},
year = {2014},
doi = {10.1016/j.microrel.2014.07.061},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.061},
researchr = {https://researchr.org/publication/WeberBVLSCW14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {2064-2069},
}