Dallas Webster, Rick Hudgens, Donald Y. C. Lie. Replacing Error Vector Magnitude Test with RF and Analog BISTs. IEEE Design & Test of Computers, 28(6):66-75, 2011. [doi]
@article{WebsterHL11,
title = {Replacing Error Vector Magnitude Test with RF and Analog BISTs},
author = {Dallas Webster and Rick Hudgens and Donald Y. C. Lie},
year = {2011},
doi = {10.1109/MDT.2011.1},
url = {http://doi.ieeecomputersociety.org/10.1109/MDT.2011.1},
researchr = {https://researchr.org/publication/WebsterHL11},
cites = {0},
citedby = {0},
journal = {IEEE Design & Test of Computers},
volume = {28},
number = {6},
pages = {66-75},
}