A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs - researchr publication authors

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Jae-Kyung Wee, Kyeong-Sik Min, Jong-Tai Park, Sang Pil Lee, Young-Hee Kim, Tae-Heum Yang, Jong-Doo Joo, Jin-Yong Chung. A post-package bit-repair scheme using static latches with bipolar-voltage programmable antifuse circuit for high-density DRAMs. J. Solid-State Circuits, 37(2):251-254, 2002. [doi]

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