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On-the-Fly Formal Testing of a Smart Card Applet

Arjen van Weelden, Martijn Oostdijk, Lars Frantzen, Pieter W. M. Koopman, Jan Tretmans. On-the-Fly Formal Testing of a Smart Card Applet. In Ryoichi Sasaki, Sihan Qing, Eiji Okamoto, Hiroshi Yoshiura, editors, Security and Privacy in the Age of Ubiquitous Computing, IFIP TC11 20th International Conference on Information Security (SEC 2005), May 30 - June 1, 2005, Chiba, Japan. pages 565-576, Springer, 2005.

Authors

Arjen van Weelden

This author has not been identified. Look up 'Arjen van Weelden' in Google

Martijn Oostdijk

This author has not been identified. Look up 'Martijn Oostdijk' in Google

Lars Frantzen

Identified as Lars Frantzen

Pieter W. M. Koopman

This author has not been identified. Look up 'Pieter W. M. Koopman' in Google

Jan Tretmans

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