Arjen van Weelden, Martijn Oostdijk, Lars Frantzen, Pieter W. M. Koopman, Jan Tretmans. On-the-Fly Formal Testing of a Smart Card Applet. In Ryoichi Sasaki, Sihan Qing, Eiji Okamoto, Hiroshi Yoshiura, editors, Security and Privacy in the Age of Ubiquitous Computing, IFIP TC11 20th International Conference on Information Security (SEC 2005), May 30 - June 1, 2005, Chiba, Japan. pages 565-576, Springer, 2005.
@inproceedings{WeeldenOFKT05,
title = {On-the-Fly Formal Testing of a Smart Card Applet},
author = {Arjen van Weelden and Martijn Oostdijk and Lars Frantzen and Pieter W. M. Koopman and Jan Tretmans},
year = {2005},
tags = {testing},
researchr = {https://researchr.org/publication/WeeldenOFKT05},
cites = {0},
citedby = {0},
pages = {565-576},
booktitle = {Security and Privacy in the Age of Ubiquitous Computing, IFIP TC11 20th International Conference on Information Security (SEC 2005), May 30 - June 1, 2005, Chiba, Japan},
editor = {Ryoichi Sasaki and Sihan Qing and Eiji Okamoto and Hiroshi Yoshiura},
publisher = {Springer},
isbn = {0-387-25658-X},
}